12 - 14 March, 2024
Hotel Savoyen Vienna
Vienna, Austria
Events
Marla Dowell
National Institute of Standards and Technology
Advancing Metrology for Microelectronics: CHIPS Metrology Program
Under the CHIPS and Science Act of 2022, NIST is expanding its support of the microelectronics technology and manufacturing ecosystem by developing, advancing and deploying measurement technologies that are accurate, precise and fit-for-purpose.
About the Speaker
Dr. Marla Dowell is the Director of the CHIPS Metrology Program and NIST Boulder Laboratory. She began her NIST career as a researcher in the field of optical metrology for photolithography. Dowell has represented NIST on national and international committees on research innovation, photonics and communications. Dowell’s abilities to foster collaborations with both private and public sector partners and to lead high performing research organizations have been recognized with numerous awards, including the Allen V. Astin Award, the Arthur S. Flemming Award from George Washington University and the Presidential Distinguished Rank Award. Dowell is a member of the Federal Innovation Council and serves on the board of the Optics and Electro-Optics Standards Council.
