Quantum Sensing and Metrology (QSM)

Quantum Sensing and Metrology (QSM) focuses on highlighting the advancements in the field of quantum technologies in applications ranging from the nanoworld to space, from bioscience to gravitational wave detection, and beyond.

This meeting spans quantum sensing technologies with real-world applications as well as the development of devices and techniques that will advance sensing performance.

Presented work will include reports of quantum sensing and metrology that utilize the quantum properties of matter (such as quantized transitions in neutral atoms, ions, and spin qubits) or quantum phenomena (including entanglement between different qubits or degrees of freedom) to measure physical quantities with unparalleled sensitivity, precision, and accuracy. Presenters are encouraged to share their experiences relating to sensing and imaging utilizing quantum states of light, development of quantum sources and detectors, as well as metrology techniques involving quantum properties of matter.

See Topic Categories >

Chairs

Philippe Bouyer

Univ. Amsterdam and Tec. Univ. Eindhoven, Netherlands,
General Chair

Jennifer Choy

University of Wisconsin-Madison, United States,
General Chair

Tatevik Chalyan

Vrije Universiteit Brussel,
Program Chair

Michael Semmlinger

Hamamatsu Corporation, United States,
Program Chair

Jean-Philippe Tetienne

Royal Melbourne Institute of Technology, Australia,
Program Chair

Quntao Zhuang

University of Southern California, United States,
Program Chair

Committee Members

• Philippe Bouyer, Univ. Amsterdam and Tec. Univ. Eindhoven, Netherlands, General Chair
• Jennifer Choy, University of Wisconsin-Madison, United States, General Chair
• Tatevik Chalyan, Vrije Universiteit Brussel, Program Chair
• Michael Semmlinger, Hamamatsu Corporation, United States, Program Chair
• Jean-Philippe Tetienne, Royal Melbourne Institute of Technology, Australia, Program Chair
• Quntao Zhuang, University of Southern California, United States, Program Chair