Events
1. EUV through hard-x-ray sources and components
- Compact storage ring sources
- Compact Free-electron lasers
- Inverse Compton scattering sources
- Laser and discharge produced plasma sources
- Terahertz-based sources
- X-ray laser sources
- High-harmonic generation sources
- Radio frequency cavities and guns
- Undulators and wigglers (including permanent magnet, short-period microwave and THz undulators, superconducting devices)
- Magnets and multiband achromats
- High power lasers
- Vacuum chambers and components
- Others
2. Applications
- EUV lithography and mask inspection
- Semiconductor wafer inspection and metrology
- Phase contrast imaging and tomography
- Medical and clinical imaging
- Biological imaging
- Macromolecular crystallography
- Cultural heritage studies
- Non-destructive testing
- Ultrafast and dynamic studies
- Wide field imaging
- Others
3. Instrumentation, optics, detectors, data management and processing
